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°øÁ¤ |
Àåºñ¸í |
¿ëµµ |
Deposition |
Furnace/LPCVD1,2 |
Sio2 »êȸ· Çü¼º |
Furnace/LPCVD(P) |
»êȸ·/Æú¸®½Ç¸®ÄÜ |
LPCVD3,4 |
¹Ú¸·(Sio2,SixNx)ÁõÂø |
PECVD1 |
¹Ú¸·(Sio2,SixNx)ÁõÂø |
PECVD2 |
¹Ú¸·(Sio2,SixNx)ÁõÂø |
Parylene packaging sys |
°íºÐÀÚ À¯±â¹° ÁõÂø |
E-Beam Evaporator |
Metal ¹Ú¸· ÁõÂø |
SG101 Electroform Sys |
Ni µµ±Ý |
Sputter |
´ÙÃþ ±Ý¼Ó ÁõÂø |
Etching |
RIE 1 |
¹Ú¸· ½Ä°¢ |
RIE 2 |
¹Ú¸· ½Ä°¢ |
Deep Trench RIE(Si) |
Silicon ½Ä°¢ |
AOE Etcher (Metal) |
Metal½Ä°¢ |
Oxford Etcher(ÈÇÕ¹°) |
È¥ÇÕ¹° ½Ä°¢ |
XeF2 Etcher |
Silicon ½Ä°¢ |
Microwave Plasma Asher |
Æú¸®¸Ó Á¦°Å |
M-2000 Laser |
Die Saw/Patterning |
Ion milling |
¹Ú¸·½Ä°¢ |
Inspection |
Micro Scope 1 |
Depth ÃøÁ¤/Inspection |
Micro Scope 2 |
CDÃøÁ¤/Inspection |
Micro Scope 2 |
CD/Depth/Inspection |
Nanospec |
¹Ú¸·µÎ²² ÃøÁ¤ |
4-Point Probe |
ÀúÇ× ÃøÁ¤
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Alphastep(ASIQ) |
´ÜÂ÷ÃøÁ¤ |
E-SEM |
Profile ÃøÁ¤ |
Camscope |
surface Inspection |
Photo Lithography |
E-Beam Lithography |
Nano Pattern ±¸Çö/Mask Á¦ÀÛ |
MA6 2 |
Lithography °øÁ¤ |
NANOTEC |
Lithography °øÁ¤ |
Spin Coater 1(4"¿ë) |
PR Coating |
Spin Coater 2(Á¶°¢) |
PR Coating |
Spin Dryer/Coater |
PR Coating |
Oven/Hot Plate |
PR Baking |
Hot Plate System |
PR Coating |
Assembly |
Wire Bonder |
Wire Bonding |
Wafer Bonder |
Wafer Bonding |
Wet-Station |
Acid Wet-Station |
Chemical ½Ä°¢/¼¼Á¤ |
Organic Wet-Station 1 |
Chemical ½Ä°¢/¼¼Á¤ |
KOH Wet-Station |
Silicon ½À½Ä½Ä°¢ |
Organic Wet-Station 2 |
Chemical ½Ä°¢/¼¼Á¤ |
Spin Rinse Dryer |
Wafer °ÇÁ¶ |
Ultrasonic |
Chemical ¼¼Á¤ |
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